Electron & Ion microscopy and microanalysis: Principles and applications
By: Murr, Lawrence E.
Publisher: New York, Marcel Dekker, Inc. ; 1982Description: 793.ISBN: 0824715535.Subject(s): Electrons/ Ions/ Electron emission/ Ionization microscopyDDC classification: 578. 45 MURItem type | Current location | Call number | Status | Date due | Barcode |
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College of Agriculture, Vellayani | 578. 45 MUR (Browse shelf) | Available | KAU_COAV-20083 |
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