TY  - GEN
AU  - Russ, John C
TI  - Computer- assisted microscopy: the measurement and analysis of images
SN  - 0-306-43410-5
U1  - 502.820 285 RUS 
CY  - Newyork, Plenum press
KW  - Microscopy- computer asso\isted/ image processing/ optical pattern recognition/ microscope- dataprocessing
ER  -