TY  - GEN
AU  - Murr, Lawrence E
TI  - Electron & Ion microscopy and microanalysis: Principles and applications
SN  - 0824715535
U1  - 578. 45 MUR 
CY  - New York, Marcel Dekker, Inc.
KW  - Electrons/ Ions/ Electron emission/ Ionization microscopy
ER  -