| 000 | 004340000a22001570004500 | ||
|---|---|---|---|
| 020 | _a0824715535 | ||
| 060 | _a100 | ||
| 082 | _a578. 45 MUR | ||
| 100 | _aMurr, Lawrence E | ||
| 245 | _aElectron & Ion microscopy and microanalysis: Principles and applications | ||
| 260 | _aNew York, Marcel Dekker, Inc. | ||
| 260 | _c1982 | ||
| 300 | _a793 | ||
| 650 | _aElectrons/ Ions/ Electron emission/ Ionization microscopy | ||
| 942 | _cBK | ||
| 999 |
_c351020 _d351020 |
||