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http://hdl.handle.net/123456789/5697Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.advisor | Radhadevi, D S | - |
| dc.contributor.author | Renjana G Nair | - |
| dc.date.accessioned | 2019-06-24T05:42:21Z | - |
| dc.date.available | 2019-06-24T05:42:21Z | - |
| dc.date.issued | 2006 | - |
| dc.identifier.sici | 172601 | en_US |
| dc.identifier.uri | http://hdl.handle.net/123456789/5697 | - |
| dc.language.iso | en | en_US |
| dc.publisher | Department of Plant Breeding and Genetics, College of Agriculture, Vellayani | en_US |
| dc.subject | Plant breeding | en_US |
| dc.title | Genetic analysis of yield and fusarium wilt resistance in line x tester progeny of yard long bean (vigna unguiculata subsp. sesquipedalis (L) verdcourt) | en_US |
| dc.type | Thesis | en_US |
| Appears in Collections: | PG Thesis | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 172601.pdf | 3.92 MB | Adobe PDF | View/Open |
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