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Please use this identifier to cite or link to this item:
http://hdl.handle.net/123456789/5697
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.advisor | Radhadevi, D S | - |
dc.contributor.author | Renjana G Nair | - |
dc.date.accessioned | 2019-06-24T05:42:21Z | - |
dc.date.available | 2019-06-24T05:42:21Z | - |
dc.date.issued | 2006 | - |
dc.identifier.sici | 172601 | en_US |
dc.identifier.uri | http://hdl.handle.net/123456789/5697 | - |
dc.language.iso | en | en_US |
dc.publisher | Department of Plant Breeding and Genetics, College of Agriculture, Vellayani | en_US |
dc.subject | Plant breeding | en_US |
dc.title | Genetic analysis of yield and fusarium wilt resistance in line x tester progeny of yard long bean (vigna unguiculata subsp. sesquipedalis (L) verdcourt) | en_US |
dc.type | Thesis | en_US |
Appears in Collections: | PG Thesis |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
172601.pdf | 3.92 MB | Adobe PDF | View/Open |
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