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http://hdl.handle.net/123456789/5697| Title: | Genetic analysis of yield and fusarium wilt resistance in line x tester progeny of yard long bean (vigna unguiculata subsp. sesquipedalis (L) verdcourt) |
| Authors: | Radhadevi, D S Renjana G Nair |
| Keywords: | Plant breeding |
| Issue Date: | 2006 |
| Publisher: | Department of Plant Breeding and Genetics, College of Agriculture, Vellayani |
| URI: | http://hdl.handle.net/123456789/5697 |
| Appears in Collections: | PG Thesis |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 172601.pdf | 3.92 MB | Adobe PDF | View/Open |
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