Genetic analysis of yield and fusarium wilt resistance in line x tester progeny of yard long bean (vigna unguiculata subsp. sesquipedalis (L) verdcourt)

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dc.contributor.advisorRadhadevi, D S
dc.contributor.authorRenjana G Nair
dc.date.accessioned2019-06-24T05:42:21Z
dc.date.available2019-06-24T05:42:21Z
dc.date.issued2006
dc.identifier.sici172601en_US
dc.identifier.urihttp://hdl.handle.net/123456789/5697
dc.language.isoenen_US
dc.publisherDepartment of Plant Breeding and Genetics, College of Agriculture, Vellayanien_US
dc.subjectPlant breedingen_US
dc.titleGenetic analysis of yield and fusarium wilt resistance in line x tester progeny of yard long bean (vigna unguiculata subsp. sesquipedalis (L) verdcourt)en_US
dc.typeThesisen_US

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